NEX QC+ QuantEZ - Benchtop EDXRF Spectrometer from Rigaku Americas Corporation

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NEX QC+ QuantEZ - Benchtop EDXRF Spectrometer

Description

The Rigaku NEX QC+ QuantEZ delivers wide elemental coverage with a easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids and slurries.

Especially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility and ease-of-use of the NEX QC+ QuantEZ add to its broad appeal for an ever-expanding range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants — such as analytical quality control (AQC), quality assurance (QA) or statistical process control like Six Sigma — the NEX QC+ QuantEZ series is the reliable choice for routine elemental analysis.

50 kV X-ray Tube and SDD
The shuttered 50kV X-ray tube and Peltier cooled silicon drift detector (SDD) detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).

Options: Autosampler, Helium, and FP
Options include fundamental parameters, automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity.

NEX QC+ QuantEZ Features & Benefits
  • Analyze sodium (Na) to uranium (U) non-destructively
  • Powerful QuantEZ Windows-based software
  • Solids, liquids, alloys, powders, and thin films
  • 50 kV X-ray tube for wide elemental coverage
  • Silicon drift detector (SDD) for superior resolution
  • Multiple automated tube filters
  • Unmatched performance-to-price ratio
  • Optional RPF-SQX fundamental parameters